Test a product for years of service in a fraction of the time
Generate an accelerated vibration test profile to estimate a DUT’s life expectancy and determine the potential failures with standard use. The vibration Test Acceleration software package includes three industry-leading methods for accelerating test profiles: FDS for random, SRS for shock, and Vibration Research’s STAG for sine-on-random.
Use recorded data to create an accelerated random test that represents a lifetime of fatigue damage.
The fatigue damage spectrum (FDS) is a standard vibration test acceleration tool that replicates the operational environment of the DUT. It is used to create an accelerated random test using recorded data. The resulting test is the damage equivalent to the DUT’s lifespan.
FDS is based on Miner’s rule of damage:
Fatigue damage will accumulate over time until it reaches a level that causes a crack or other deformation of a product.
In VibrationVIEW, set the DUT’s target life and test duration based on test/product specifications. The software automatically calculates the ratio that will produce the same amount of fatigue damage in the user-defined test duration.
Displays Imported File Statistics
Quickly determine waveform statistics. FDS in VibrationVIEW displays the peak acceleration, velocity, and displacement as well as the kurtosis of the time history file.
Configurable Process Parameters
Define the slope of the s/n curve (beta) and quality factor (Q).
Move from Analysis to Control
With one click, begin controlling a new test profile on a shaker system. Within the same program, move from a time waveform to control on a breakpoint profile.
Supports Multiple Waveforms
Calculate the combined fatigue of multiple weighted waveforms. Overlay and compare multiple waveforms on a single plot.
Shock Response Spectrum (SRS)
Modify the wavelets associated with a time history waveform to meet SRS demand.
The SRS straightforwardly characterizes a shock environment and can be used to define a test with enveloped data from multiple shock events.
The SRS allows engineers to better visualize the effects of a shock on a physical system. A designer can see the maximum dynamic load of various components or assemblies of a total system under test as a function of frequency. This information can be correlated to the damage potential based on an input response.
In VibrationVIEW, use a synthetic pulse or a user-defined time history waveform as the starting point. The software will continuously modify the wavelets to adjust the time history waveform and meet the SRS demand. Make minor adjustments to the original time history file, meet or exceed an RRS, and control on SRS vs. UDT.
Supports Various Generation Techniques
Supports various synthetic waveforms including linear and exponential chirp, wavesyn, burst random, linear and exponential chirp on burst random, enveloped random, and burst sine. Alternatively, iterate an SRS waveform from a recorded waveform.
Manual Wavelet Manipulation
Manually adjust the parameters of the underlying wavelets or allow VibrationVIEW to automatically create and run the test without intervention.
Sine Tracking Analysis and Generation (STAG)
Generate an accelerated Sine-on-Random test reflective of an environment with dominant sinusoidal vibration.
Requires ObserVIEW and VibrationVIEW software
STAG is a real-world evaluation for products that experience dominant rotational vibration rendered as sinusoidal on a shaker table.
Standard random vibration test acceleration cannot accurately replicate an environment with dominant rotational vibration because both the sine and random background vibration must be analyzed and generated. The more accurate option is a combination of sine and random testing. A Sine-on-Random test can replicate dominant sinusoidal vibration and its orders as well as produce more consistent results than a random test.
The STAG software allows the user to analyze the order content of a waveform. The orders are then extracted, and accelerated sine tone profiles are generated. The accelerated profiles are combined with the FDS analysis of the remaining random content. Combined with FDS, the STAG tool allows for the analysis, acceleration, and generation of a real-life test.
30-Second Processing Time Save time and reduce transposition errors by importing the analyzed sinusoidal data from ObserVIEW to VibrationVIEW. The orders are extracted from the recording before the background time waveform is processed to make sure the FDS accelerates random data only.
Analyze Order Content Orders of importance can be manually chosen or automatically detected. Analyze the frequency ranges with dominant sine tones and modify the sine tone profile as necessary, including minimizing the low amplitude content or concentrating on a particular peak.